Subhadeep Mukhopadhyay : rechercher sur Z-Library

Le plus grand référentiel d'articles scientifiques au monde. 70,000,000+ d'articles gratuitement.

Don't use scam websites

Livres
Articles (36)
Les plus populaires
Liste
- Liste
- Tableau

1

Nonparametric Distributed Learning Architecture for Big Data: Algorithm and Applications

Bruce, Scott, Li, Zeda, Chieh, Alex Hsiang, Mukhopadhyay, Subhadeep

Journal:

IEEE Transactions on Big Data

Année:

2018

Langue:

english

Fichier:

PDF, 2.91 MB

english, 2018

2

Nonparametric universal copula modeling

Mukhopadhyay, Subhadeep, Parzen, Emanuel

Journal:

Applied Stochastic Models in Business and Industry

Année:

2020

Fichier:

PDF, 2.35 MB

2020

3

LPiTrack: Eye movement pattern recognition algorithm and application to biometric identification

Mukhopadhyay, Subhadeep, Nandi, Shinjini

Journal:

Machine Learning

Année:

2017

Langue:

english

Fichier:

PDF, 1.08 MB

english, 2017

4

Interaction of Lewis number and heat loss effects for a laminar premixed flame propagating in a channel

Subhadeep Chakraborty, Achintya Mukhopadhyay, Swarnendu Sen

Journal:

International Journal of Thermal Sciences

Année:

2008

Langue:

english

Fichier:

PDF, 399 KB

english, 2008

5

[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - A consistent physical framework for N and P BTI in HKMG MOSFETs

Joshi, Kaustubh, Mukhopadhyay, Subhadeep, Goel, Nilesh, Mahapatra, Souvik

Année:

2012

Langue:

english

Fichier:

PDF, 571 KB

english, 2012

6

System reliability analysis of soil slopes with general slip surfaces using multivariate adaptive regression splines

Metya, Subhadeep, Mukhopadhyay, Tanmoy, Adhikari, Sondipon, Bhattacharya, Gautam

Journal:

Computers and Geotechnics

Année:

2017

Langue:

english

Fichier:

PDF, 5.14 MB

english, 2017

7

A Comprehensive DC and AC PBTI Modeling Framework for HKMG n-MOSFETs

Mukhopadhyay, Subhadeep, Parihar, Narendra, Goel, Nilesh, Mahapatra, Souvik

Journal:

IEEE Transactions on Electron Devices

Année:

2017

Langue:

english

Fichier:

PDF, 1.96 MB

english, 2017

8

[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - Resolution of disputes concerning the physical mechanism and DC/AC stress/recovery modeling of Negative Bias Temperature Instability (NBTI) in p-MOSFETs

Parihar, Narendra, Sharma, Uma, Mukhopadhyay, Subhadeep, Goel, Nilesh, Chaudhary, Ankush, Rao, Rakesh, Mahapatra, Souvik

Année:

2017

Langue:

english

Fichier:

PDF, 635 KB

english, 2017

9

Time-zero-variability and BTI impact on advanced FinFET device and circuit reliability

Mukhopadhyay, Subhadeep, Lee, Yung-Huei, Lee, Jen-Hao

Journal:

Microelectronics Reliability

Année:

2018

Langue:

english

Fichier:

PDF, 2.42 MB

english, 2018

10

Bayesian multiscale smoothing in supervised and semi-supervised kernel discriminant analysis

Subhadeep Mukhopadhyay, Anil K. Ghosh

Journal:

Computational Statistics & Data Analysis

Année:

2011

Langue:

english

Fichier:

PDF, 348 KB

english, 2011

11

Nanoscale surface modifications to control capillary flow characteristics in PMMA microfluidic devices

Subhadeep Mukhopadhyay, Susanta S Roy, Raechelle A D’Sa, Ashish Mathur, Richard J Holmes, James A McLaughlin

Journal:

Nanoscale Research Letters

Année:

2011

Langue:

english

Fichier:

PDF, 437 KB

english, 2011

12

Effects of liquid viscosity, surface wettability and channel geometry on capillary flow in SU8 based microfluidic devices

Mukhopadhyay, Subhadeep, Banerjee, J.P., Roy, S.S.

Journal:

International Journal of Adhesion and Adhesives

Année:

2013

Langue:

english

Fichier:

PDF, 850 KB

english, 2013

13

Understanding Process Impact of Hole Traps and NBTI in HKMG p-MOSFETs Using Measurements and Atomistic Simulations

Mahapatra, Souvik, De, Sandip, Joshi, Kaustubh, Mukhopadhyay, Subhadeep, Pandey, Rajan K., Murali, K. V. R. M.

Journal:

IEEE Electron Device Letters

Année:

2013

Langue:

english

Fichier:

PDF, 516 KB

english, 2013

14

A Detailed Study of Gate Insulator Process Dependence of NBTI Using a Compact Model

Joshi, Kaustubh, Mukhopadhyay, Subhadeep, Goel, Nilesh, Nanware, Nirmal, Mahapatra, Souvik

Journal:

IEEE Transactions on Electron Devices

Année:

2014

Langue:

english

Fichier:

PDF, 1.77 MB

english, 2014

15

Microparticle filtration using carbon nanotubes and impedance characterisation for gold microelectrodes sensor system

Mathur, Ashish, Hamad, Eyad M, Mukhopadhyay, Subhadeep, Sinha Roy, Susanta, McLaughlin, Jim A

Journal:

MRS Proceedings

Année:

2009

Langue:

english

Fichier:

PDF, 410 KB

english, 2009

16

[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Intrinsic correlation between PBTI and TDDB degradations in nMOS HK/MG dielectrics

Yang, Jiaqi, Masuduzzaman, Muhammad, Joshi, Kaustubh, Mukhopadhyay, Subhadeep, Kang, Jinfeng, Mahapatra, Souvik, Alam, Muhammad A.

Année:

2012

Langue:

english

Fichier:

PDF, 365 KB

english, 2012

17

EXPERIMENTAL STUDIES OF SURFACE-DRIVEN CAPILLARY FLOW IN PMMA MICROFLUIDIC DEVICES PREPARED BY DIRECT BONDING TECHNIQUE AND PASSIVE SEPARATION OF MICROPARTICLES IN MICROFLUIDIC LABORATORY-ON-A-CHIP SYSTEMS

MUKHOPADHYAY, SUBHADEEP, BANERJEE, J. P., MATHUR, ASHISH, TWEEDIE, M., MCLAUGHLIN, J. A., ROY, SUSANTA SINHA

Journal:

Surface Review and Letters

Année:

2015

Langue:

english

Fichier:

PDF, 1.28 MB

english, 2015

18

An Experimental Perspective of Trap Generation Under BTI Stress

Mukhopadhyay, Subhadeep, Mahapatra, Souvik

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 2.64 MB

english, 2015

19

[IEEE 2015 73rd Annual Device Research Conference (DRC) - Columbus, OH, USA (2015.6.21-2015.6.24)] 2015 73rd Annual Device Research Conference (DRC) - Electron trapping dominance in strained germanium quantum well planar and FinFET devices with NBTI

Agrawal, Nidhi, Agrawal, Ashish, Mukhopadhyay, Subhadeep, Mahapatra, Souvik, Datta, Suman

Année:

2015

Langue:

english

Fichier:

PDF, 873 KB

english, 2015

20

Large-scale signal detection: A unified perspective

Mukhopadhyay, Subhadeep

Journal:

Année:

2016

Langue:

english

Fichier:

PDF, 262 KB

english, 2016

21

A Comparative Study of NBTI and PBTI Using Different Experimental Techniques

Mukhopadhyay, Subhadeep, Goel, Nilesh, Mahapatra, Souvik

Journal:

IEEE Transactions on Electron Devices

Année:

2016

Langue:

english

Fichier:

PDF, 1.78 MB

english, 2016

22

A penalized empirical likelihood method in high dimensions

Lahiri, Soumendra N., Mukhopadhyay, Subhadeep

Journal:

The Annals of Statistics

Année:

2012

Langue:

english

Fichier:

PDF, 317 KB

english, 2012

23

EXPERIMENTAL INVESTIGATIONS ON THE INTERACTIONS BETWEEN LIQUIDS AND STRUCTURES TO PASSIVELY CONTROL THE SURFACE-DRIVEN CAPILLARY FLOW IN MICROFLUIDIC LAB-ON-A-CHIP SYSTEMS TO SEPARATE THE MICROPARTICLES FOR BIOENGINEERING APPLICATIONS

MUKHOPADHYAY, SUBHADEEP

Journal:

Surface Review and Letters

Année:

2016

Langue:

english

Fichier:

PDF, 715 KB

english, 2016

24

EFFECTS OF SURFACE PROPERTIES ON FLUID ENGINEERING GENERATED BY THE SURFACE-DRIVEN CAPILLARY FLOW OF WATER IN MICROFLUIDIC LAB-ON-A-CHIP SYSTEMS FOR BIOENGINEERING APPLICATIONS

MUKHOPADHYAY, SUBHADEEP, BANERJEE, JYOTI PRASAD, ROY, SUSANTA SINHA, METYA, SANJEEV KUMAR, TWEEDIE, MARK, McLAUGHLIN, JAMES ANDREW

Journal:

Surface Review and Letters

Année:

2017

Langue:

english

Fichier:

PDF, 692 KB

english, 2017

25

EXPERIMENTAL INVESTIGATIONS ON THE SURFACE-DRIVEN CAPILLARY FLOW OF AQUEOUS MICROPARTICLE SUSPENSIONS IN THE MICROFLUIDIC LABORATORY-ON-A-CHIP SYSTEMS

MUKHOPADHYAY, SUBHADEEP

Journal:

Surface Review and Letters

Année:

2017

Langue:

english

Fichier:

PDF, 3.07 MB

english, 2017

26

Large-scale mode identification and data-driven sciences

Mukhopadhyay, Subhadeep

Journal:

Electronic Journal of Statistics

Année:

2017

Langue:

english

Fichier:

PDF, 421 KB

english, 2017

27

[IEEE 2015 6th International Conference on Computers and Devices for Communication (CODEC) - Kolkata, India (2015.12.16-2015.12.18)] 2015 6th International Conference on Computers and Devices for Communication (CODEC) - Nanoscale coating in microfluidic laboratory-on-a-chip devices fabricated by microelectronic technologies

Mukhopadhyay, Subhadeep, Banerjee, J. P.

Année:

2015

Langue:

english

Fichier:

PDF, 272 KB

english, 2015

28

[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - Ultrafast PBTI characterization on Si-free gate last Ge nFETs with stable and ultrathin Al2O3 IL

Joishi, Chandan, Kothari, Shraddha, Ghosh, Sayantan, Mukhopadhyay, Subhadeep, Mahapatra, Souvik, Lodha, Saurabh

Année:

2017

Langue:

english

Fichier:

PDF, 796 KB

english, 2017

29

BTI Analysis Tool-Modeling of NBTI DC, AC Stress and Recovery Time Kinetics, Nitrogen Impact, and EOL Estimation

Parihar, Narendra, Goel, Nilesh, Mukhopadhyay, Subhadeep, Mahapatra, Souvik

Journal:

IEEE Transactions on Electron Devices

Année:

2017

Langue:

english

Fichier:

PDF, 4.13 MB

english, 2017

30

AIP Conference Proceedings [AIP BAYESIAN INFERENCE AND MAXIMUM ENTROPY METHODS IN SCIENCE AND ENGINEERING: The 29th International Workshop on Bayesian Inference and Maximum Entropy Methods in Science and Engineering - Oxford (Mississippi) (5–10 July 2009)] - Bayesian Analysis of High Dimensional Classification

Mukhopadhyay, Subhadeep, Liang, Faming, Goggans, Paul M., Chan, Chun-Yong

Année:

2009

Langue:

english

Fichier:

PDF, 784 KB

english, 2009

31

Generalized Empirical Bayes Modeling via Frequentist Goodness of Fit

Mukhopadhyay, Subhadeep, Fletcher, Douglas

Journal:

Scientific Reports

Année:

2018

Langue:

english

Fichier:

PDF, 1.74 MB

english, 2018

32

Understanding PBTI in Replacement Metal Gate Ge n-Channel FETs With Ultrathin Al₂O₃ and GeOₓ ILs Using Ultrafast Charge Trap-Detrap Techniques

Joishi, Chandan, Ghosh, Sayantan, Kothari, Shraddha, Parihar, Narendra, Mukhopadhyay, Subhadeep, Mahapatra, Souvik, Lodha, Saurabh

Journal:

IEEE Transactions on Electron Devices

Année:

2018

Langue:

english

Fichier:

PDF, 2.83 MB

english, 2018

33

Decentralized nonparametric multiple testing

Mukhopadhyay, Subhadeep

Journal:

Journal of Nonparametric Statistics

Année:

2018

Langue:

english

Fichier:

PDF, 2.03 MB

english, 2018

34

Nonlinear Time Series Modeling: A Unified Perspective, Algorithm and Application

Mukhopadhyay, Subhadeep, Parzen, Emanuel

Journal:

Journal of Risk and Financial Management

Année:

2018

Langue:

english

Fichier:

PDF, 1.53 MB

english, 2018

35

Effect of mole fraction, doping concentration and gate length on the electrical characteristics of nanoelectronic High Electron Mobility Transistor

Kalita, Sanjib, Mukhopadhyay, Subhadeep

Journal:

Materials Today: Proceedings

Année:

2019

Langue:

english

Fichier:

PDF, 978 KB

english, 2019

36

A nonparametric approach to high-dimensional k-sample comparison problems

Mukhopadhyay, Subhadeep

Journal:

Année:

2020

Fichier:

PDF, 415 KB

2020